VIS-NIR Spectrum Wavefront Sensors

VIS-NIR Spectrum Wavefront Sensors

VIS-NIR Spectrum Wavefront Sensors - 宏惠光電股份有限公司

產品名稱 : VIS-NIR Spectrum Wavefront Sensors
產品說明 :

產品規格
PRODUCT NAME PUPIL SIZE W x L (mm2) PHASE POINT RESOLUTION MICROLENS NUMBER / (LIFT PH. P. RES.) MAX FREQ. (Hz) WAVELENGTH (nm) REPEATABILITY (RMS λ/n) ABSOLUTE ACCURACY (RMS λ/n)
HASO4 Broadband 6.9 x 5.1 3400 68 x 50 58 350 - 1100 200 100
HASO4 FIRST 4.5 x 3.7 1 584 44 x 36 125 350 - 1100 200 100
HASO4 FAST 1.19 x 1.19 256 16 x 16 1250 400 - 900 200 100
HASO4 126 BROADBAND 13.8 x 10.2 21420 170 x 126 30 350 - 1100 200 100
HASO LP 22 x 22 16384 128 X 128 10 400 - 800 200 100
HASO4 126 VIS 13.8 x 10.2 21420 170 x 126 30 400 - 750 200 100
HASO LIFT 272 7.0 x 5.2 54400 68 x 50 20 400 - 750 200 100
HASO LIFT 680 13.78 x 10.21 342720 170 x 126 / (680 x 504) 30 400 - 750 200 100

 

HASO4 Broadband HASO4 FIRST HASO4 FAST
BEST FOR
– A great choice for lab or industrial application.
– Sucessfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
– Optimizes the aligment of complex systems on and off-axis 3D MTF.		 BEST FOR
– Adaptive Optics applications for microscopy or UHIL
– OEM applicaitons in optical metrology and beam diagnostics
– AO for high-power laser optimization		 BEST FOR
– Loops compensatinf for atmospheric turbulence
– Laser beam optimization
– Freespace communications
HASO4 126 BROADBAND HASO LP HASO4 126 VIS
BEST FOR
– High spacial samplig frequency
– Very large dynamic range
– Freeform optics characterization
– Parabolic mirrors characterization
– High spacial frequency aberrations		 BEST FOR
– Large beam direct testing with no relay optics
– Laser characterization and alignment
– High spatial frequency aberrations analysis
– Large dynamic range compatibility		 BEST FOR
– High spacial samplig frequency
– Very large dynamic range
– Freeform optics characterization
– Parabolic mirrors characterization
– High spacial frequency aberrations
HASO LIFT 272 HASO LIFT 680  
 
BEST FOR
– A great choice for lab or industrial application
– Successfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
– Optimize the alignment of complex systems
– On and off-axis 3D MTF		 BEST FOR
– High spatial sampling frequency
– Very large dynamic range
– Freeform optics characterization
– Parabolic mirrors characterization
– High spatial frequency aberrations		  

 

返回