190 to 1100nm Silicon Detector Scanning Slit
190 to 1100nm Silicon Detector Scanning Slit
產品名稱 : 190 to 1100nm Silicon Detector Scanning Slit
產品說明 :
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. The NanoScan software is available in two versions: Standard and Professional.
產品規格
| NanoScan 2s Scanhead Model | Si/3.5/1.8µm | Si/9/5µm |
|---|---|---|
| Wavelength | 190nm – 1100nm | 190nm – 1100nm |
| Slit Size | 1.8µm | 5µm |
| Aperture Size | 3.5mm | 9mm |
| 1/e2 Beam Diameter Range | 7µm – 3mm | 20µm – 6mm |
| Spatial Sampling Resolution | 5.3nm – 18.3µm | |
| Scan frequency | 1.25, 2.5, 5, 10, 20Hz | |
| Power Reading | User calibrated | |
| Power Aperture Window | Metalized Quartz (200mW upper limit) | |
| Laser Type | CW or Pulsed | |
| Rotation Mount | Standard | |
| Bus interface | USB 2.0 | |
| Scanhead Dimension | 76.8mm L x 63.5mm Ø | |
| 產品型號 | 產品說明 | 價格(NTD) | 產品數量 | |
|---|---|---|---|---|
| 0 | NS2s-SI-3.5-1.8-STD | Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard | - | |
| 1 | NS2s-SI-3.5-1.8-PRO | Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Pro | - | |
| 2 | NS2s-SI-9-5-STD | Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard | - | |
| 3 | NS2s-SI-9-5-PRO | Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 190-1100 nm, USB 2.0, NanoScan Pro | - |