190 to 1100nm Silicon Detector Scanning Slit
190 to 1100nm Silicon Detector Scanning Slit
Product name : 190 to 1100nm Silicon Detector Scanning Slit
Description :
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
Specification
NanoScan 2s Scanhead Model | Si/3.5/1.8µm | Si/9/5µm | Si/9/25µm |
---|---|---|---|
Wavelength | 190nm – 950nm | 190nm – 950nm | 190nm – 950nm |
Slit Size | 1.8µm | 5µm | 25µm |
Aperture Size | 3.5mm | 9mm | 9mm |
1/e2 Beam Diameter Range | 7µm – ~2.3mm | 20µm – ~6mm | 100µm – ~6mm |
Spatial Sampling Resolution | 5.3nm – 18.3µm | ||
Profile Digitization | 16-bit | ||
Scan frequency | 1.25, 2.5, 5, 10, 20Hz | ||
Power Reading | User calibrated | ||
Power Aperture Window | Metalized Quartz (200mW upper limit) | ||
Laser Type | CW or Pulsed | ||
Rotation Mount | Standard | ||
Scanhead Dimension | 63.4mm diameter x76.8mm long |
Model | Description | Price(USD) | Quantity | |
---|---|---|---|---|
0 | NS2s-SI-3.5-1.8-STD | Small Beam Scanning Slit Profiler: Silicon Detector, 3.5mm Aperture, 1.8µm Slits, Standard Software | - | |
1 | NS2s-SI-9-5-STD | Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 5µm Slits, Standard Software | - | |
2 | NS2s-SI-9-25-STD | Low Power Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 25µm Slits, Standard Software | - | |
3 | NS2s-SI-3.5-1.8-PRO | Small Beam Scanning Slit Profiler:Silicon Detector,3.5mm Aperture,1.8µm Slits,Professional Software | - | |
4 | NS2s-SI-9-5-PRO | Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 5µm Slits, Professional Software | - | |
5 | NS2s-SI-9-25-PRO | Low Power Scanning Slit Profiler: Silicon Detector, 9mm Aperture, 25µm Slits, Professional Software | - |