Metrology Systems
Metrology Systems
Product name : Metrology Systems
Description :
Specification
| MESO Metrology System | The Optical Engineer Companion SWIR | The Optical Engineer Companion |
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| KEY SPECS of MESO metrology system – Horizontal or vertical integration – Optical zoom from 1,5" (38,1mm) up to 6"(152mm) – Testing wavelength from 405 nm to 820 nm – 680 x 500 phase points resolution – 27us minimum acquisition time |
The Optical Engineer Companion SWIR specifications will obviously vary depending on the wavefront sensor and other components that are chosen for a particular setup. The R-FLEX2 SWIR platform and R-FLEX LA systems in SWIR are optimized to operate with our HASO’s wavefront sensors but carry a few limitations at the edge of wavelength ranges. | More detailed specifications of the Optical Engineer Companion specifications will obviously vary depending on the wavefront sensor and other components that are chosen for a particular setup. R-FLEX2 platforms and R-FLEX LA systems in both VIS-NIR and SWIR are optimized to operate with our HASO wavefront sensors but carry a few limitations at the edge of wavelength ranges. |
| R-FLEX LA SWIR | R-FLEX LA | R-FLEX2 SWIR |
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| A Unique set of Advantages – λ/200 rms measurement accuracy in double-pass configuration – Collimated or diverging exit beam with the F/# that matches to optics under test – Highly accurate wavefront analysis even with central obscuration and/or spider-beam types – Insensitive to vibrations and atmospheric turbulences – Removable wavefront sensor for using it as a stand-alone unit – Several accessories available , such as laser diode light sources, reference mirrors for calibration and translation stages |
Unique set of advantages R-Flex LA collimating platform – HASO R-FLEX2 with a compact beam expander – Customizable output beam size up to 150 mm – Detachable HASO R-FLEX2 for using with another beam expander or R-FLEX2 focusing modules – Suitable for fibre light sources in the 400-1100nm wavelength range – Bundled with WaveView, the industry’s most advanced metrology software and WaveKit (Software Development Kit) in C/C++, Python, and LabView |
BEST FOR VERSATILITY – Characterize optical surfaces – Characterize chromatic aberrations – Analyze the transmitted wavefront of optical systems with double-pass configuration – Optimize the alignment of complex systems – On and off-axis 3D MTF |
| R-FLEX2 | ||
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| BEST FOR VERSATILITY – A great choice for lab or industrial application – Sucessfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics. – Optimize the aligment of complex systems – On and off-axis 3D MTF |